Impedance adjusting device

ABSTRACT

An impedance adjusting device includes: a calibration node; a comparison unit configured to compare a reference voltage with a voltage of the calibration node; a counting unit configured to generate an impedance code according to a comparison result of the comparison unit; a reference impedance unit having an impedance value according to the impedance code and connected to the calibration node; a storage unit configured to store the comparison result of the comparison unit upon the generation of the impedance code being completed; an interface node; and a termination unit configured to terminate the interface node, the termination unit including a plurality of parallel resistors configured to be turned on/off according to the impedance code, and a parallel resistor configured to be turned on/off according to a value stored in the storage unit.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application claims priority of Korean Patent Application No.10-2009-0117428, filed on Nov. 30, 2009, which is incorporated herein byreference in its entirety.

BACKGROUND OF THE INVENTION

An embodiment of the present invention relates to an impedance adjustingdevice for matching impedances of input/output pads for communicationwith external circuits in a semiconductor device.

A variety of semiconductor devices are implemented with integratedcircuit chips, such as CPUs, memories, and gate arrays. Suchsemiconductor devices are incorporated in various electronic products,such as personal computers, servers, and workstations. In most cases,semiconductor devices include receiving circuits to receive a variety ofexternal signals through input pads, and output circuits to output avariety of internal signals through output pads.

Meanwhile, as the operating speeds of the electronic products increase,amplitude swings of signals transmitted between semiconductor deviceshave been gradually reduced in order to minimize the delay time totransfer signals. However, as the amplitude swings of the signals arereduced, the influence of external noise is increased, and signalreflectivity due to impedance mismatching at interfaced terminalsbecomes more severe. The impedance mismatching is caused by externalnoise or variations in power supply voltage, operating temperature orfabrication process. When impedance mismatching occurs, high-speed datatransmission may be difficult, and data outputted from data outputterminals of the semiconductor device may be distorted. Therefore, whenthe receiving circuit of the semiconductor device receives the distortedoutput signals through the input terminals, setup/hold failure or anincorrect determination of input levels may frequently occur.

Specifically, in order to solve the above-described problems, memorydevices requiring high-speed operations have adopted impedance matchingcircuits, called on-die terminations (ODTs), in the vicinity of padslocated within integrated circuit chips. In a typical ODT scheme, asource termination is performed at a transmission side by an outputcircuit, and a parallel termination is performed at a reception side bya termination circuit connected in parallel to the reception circuitconnected to an input pad.

A ZQ calibration is a process of generating impedance codes which changeaccording to variations of process, voltage and temperature (PVT)conditions. A termination impedance value is adjusted using theimpedance codes generated as a result of the ZQ calibration. Generally,a pad to which an external resistor serving as a calibration referenceis connected is referred to as a ZQ pad. For this reason, the term “ZQcalibration” is widely used.

Hereinafter, a calibration circuit for generating impedance codes and atermination circuit for terminating an input/output node using thegenerated impedance codes is described.

FIG. 1 is a diagram of a conventional calibration circuit.

Referring to FIG. 1, the conventional calibration circuit includes apull-up reference impedance unit 110, a dummy reference impedance unit120, a pull-down reference impedance unit 130, a reference voltagegeneration unit 102, comparison units 103 and 104, and counting units105 and 106.

During the operation of the conventional calibration circuit of FIG. 1,the comparison unit 103 compares a voltage of a calibration node ZQ,generated by a voltage division between an external resistor 101(hereinafter, assumed to be 120 Ω) connected to a calibration pad andthe pull-up reference impedance unit 110, with a reference voltage VREF(generally, ½*VDDQ), generated by the reference voltage generation unit102, and generates an up/down signal UP/DOWN.

The counting unit 105 receives the up/down signal UP/DOWN to generate apull-up impedance code PCODE<0:N>. The generated pull-up impedance codePCODE<0:N> is used to adjust the total impedance value of the pull-upimpedance unit 110 by turning on/off parallel resistors within thepull-up reference impedance unit 110 (the impedance values of theparallel resistors are chosen according to binary weights). The adjustedtotal impedance value of the pull-up reference impedance unit 110determines the voltage of the calibration node ZQ, and theabove-described operations are repeated. Consequently, the pull-upimpedance code PCODE<0:N> is counted up until the total impedance valueof the pull-up reference impedance unit 110 is equal to the impedancevalue of the external resistor 101 (pull-up calibration).

The pull-up impedance code PCODE<0:N>, generated by the above-describedpull-up calibration operation, is inputted to the dummy referenceimpedance unit 120 and used to determine a total impedance value of thedummy reference impedance unit 120. Subsequently, a pull-downcalibration operation is performed. In the similar manner to the pull-upcalibration operation discussed above, the pull-down calibrationoperation is performed using the comparison unit 104 and the countingunit 106, so that a voltage of a node A is equal to the referencevoltage VREF; that is, the total impedance value of the pull-downreference impedance unit 130 is equal to the total impedance value ofthe dummy reference impedance unit 120 (pull-down calibration).

The impedance code PCODE<0:N>, generated as the result of theabove-described ZQ calibration operation, is inputted to a terminationcircuit (see FIG. 2) and used to adjust a termination impedance value.

The calibration circuit does not always operate, but rather onlyoperates for a preset time duration during a set period. For example,for a DDR3 memory device, the calibration operation is performed during512 clock cycles of an initial mode. After the initial mode, thecalibration operation is performed during 256 clock cycles or 64 clockcycles according to a command. During the calibration operation, acalibration enable signal CAL_EN is activated. When the calibrationenable signal CAL_EN is activated, the comparison units 103 and 104 andthe counting units 105 and 106 operate. On the other hand, when thecalibration enable signal CAL_EN is deactivated, the comparison units103 and 104 and the counting units 105 and 106 do not operate. That is,when the calibration enable signal CAL_EN is activated, the comparisonunits 103 and 104 perform the comparison operations once during eachclock cycle, and the counting units 105 and 106 perform the countingoperations once during each clock cycle. However, when the calibrationenable signal CAL_EN is deactivated, the comparison units 103 and 104and the counting units 105 and 106 do not operate, and the impedancecode PCODE<0:N> is not changed.

FIG. 2 is a circuit diagram of a conventional termination circuit.

The termination circuit receives the impedance codes PCODE<0:N> andNCODE<0:N>, generated by the calibration circuit of FIG. 1, andterminates the interface pad.

The termination circuit includes a pull-up termination impedance unit210 and a pull-down termination impedance unit 220. The terminationcircuit may be configured with either the pull-up termination impedanceunit 210 or the pull-down termination impedance unit 220 according tothe termination scheme.

The pull-up termination impedance unit 210 is designed to have aconfiguration which is similar to that of the pull-up referenceimpedance unit 110, and receives the pull-up impedance code PCODE<0:N>.Therefore, the pull-up termination impedance unit 210 has the sameimpedance value as the pull-up reference impedance unit 110. It isapparent that the pull-up termination impedance unit 210 may be designedto have ½ times or 2 times the impedance value of the pull-up referenceimpedance unit 110 through a scaling. A pull-up termination enablesignal PU_EN is a signal which turns on/off the pull-up terminationimpedance unit 210. When the pull-up termination enable signal PU_EN isdeactivated, all of the resistors within the pull-up terminationimpedance unit 210 are turned off. On the other hand, when the pull-uptermination enable signal PU_EN is activated, the resistors within thepull-up termination impedance unit 210 are turned on/off according tothe pull-up impedance code PCODE<0:N>.

The pull-down termination impedance unit 220 has a configuration whichis similar to that of the pull-down reference impedance unit 130, andreceives the pull-down impedance code NCODE<0:N>. Therefore, thepull-down termination impedance unit 220 has the same impedance value asthe pull-down reference impedance unit 130. It is apparent that thepull-down termination impedance unit 220 may be designed to have ½ or 2times the impedance value of the pull-down reference impedance unit 130through a scaling. A pull-down termination enable signal PD_EN is asignal which turns on/off the pull-down termination impedance unit 220.When the pull-down termination enable signal PD_EN is deactivated, allof the resistors within the pull-down termination impedance unit 220 areturned off. On the other hand, when the pull-down termination enablesignal PD_EN is activated, the resistors within the pull-downtermination impedance unit 220 are turned on/off according to thepull-down impedance code NCODE<0:N>.

The above-described termination circuit may constitute an output driverconfigured to output data. When the pull-up termination enable signalPU_EN is activated, the pull-up termination impedance unit 210 generatesa “high” level at an interface pad (in this case, a pad DQ). Thus,“high” data is outputted through the interface pad. Furthermore, whenthe pull-down termination enable signal PD_EN is activated, thepull-down termination impedance unit 220 generates a “low level” at theinterface pad. Thus, “low” data is outputted through the interface pad.

FIG. 3 illustrates the variation in the voltage of the calibration nodeaccording to the calibration operation of the calibration circuit.

Referring to FIG. 3, as the calibration operation progresses, thecalibration node ZQ voltage gradually moves closer to the referencevoltage VREF. However, after a passage of a set period of time, thecalibration node ZQ voltage is no longer close to the reference voltageVREF. Since the impedance value of the pull-up reference impedance unit110 is determined by the pull-up impedance code PCODE<0:N>, thecalibration node ZQ voltage varies with a predetermined voltage swing.The calibration node ZQ voltage is different from the reference voltageVREF in that the impedance value of the pull-up reference impedance unit110 is different from the impedance value of the external resistor 101.Therefore, as the calibration node ZQ voltage gets closer to thereference voltage VREF, the accuracy of the calibration operation isfurther increased.

In order to cause the calibration node ZQ voltage to move closer to thereference voltage VREF, a method of reducing a quantization error byincreasing the number of bits of the impedance codes PCODE<0:N> andNCODE<0:N> may be considered. However, if the number of bits of theimpedance codes PCODE<0:N> and NCODE<0:N> is increased, then thecomplexity of the calibration circuit is also increased. Furthermore,whenever the number of bits is increased by one, the time necessary forthe calibration operation is increased two times. Consequently, there isa need for technology which can increase the accuracy of the calibrationoperation, without increasing the complexity of the calibration circuitand the time necessary for the calibration operation.

SUMMARY OF THE INVENTION

An embodiment of the present invention is directed to an impedanceadjusting device which is capable of increasing the accuracy of thecalibration and termination operations, without increasing the number ofimpedance code bits.

According to an embodiment of the present invention, an impedanceadjusting device includes: a comparison unit configured to compare areference voltage with a voltage of a calibration node; a counting unitconfigured to generate an impedance code according to a comparisonresult of the comparison unit; a reference impedance unit configured tohave an impedance value determined by the impedance code and connectedto the calibration node; a storage unit configured to store thecomparison result of the comparison unit upon the generation of theimpedance code being completed; and a termination unit configured toterminate an interface node, the termination unit including a pluralityof parallel resistors configured to be turned on/off in response to theimpedance code, and a parallel resistor configured to be turned on/offin response to a signal stored in the storage unit.

The interface node may include a node connected to a data pad throughwhich data is inputted or outputted.

The comparison unit and the counting unit may be configured to operateat a predetermined time period during a calibration operation, and thestorage unit is configured to store a final comparison result of thecomparison unit.

According to another embodiment of the present invention, an impedanceadjusting device includes: a first comparison unit configured to comparea reference voltage with a voltage of a first calibration node; a firstcounting unit configured to generate a pull-up impedance code accordingto a comparison result of the first comparison unit; a pull-up referenceimpedance unit configured to have an impedance value according to thepull-up impedance code and to pull up the first calibration node; adummy reference impedance unit configured to have an impedance valueaccording to the pull-up impedance code and to pull up a secondcalibration node; a second comparison unit configured to compare thereference voltage with the voltage of the second calibration node; asecond counting unit configured to generate a pull-down impedance codeaccording to a comparison result of the second comparison unit; apull-down reference impedance unit configured to have an impedance valueaccording to the pull-down impedance code and to pull down the secondcalibration node; a storage unit configured to store the comparisonresult of the second comparison unit upon the generation of the pull-upand pull-down impedance codes being completed; a pull-up terminationunit configured to pull-up terminate an interface node, the pull-uptermination unit including a plurality of parallel resistors configuredto be turned on/off according to the pull-up impedance code, and aresistor configured to be turned on/off according to a value stored inthe storage unit; and a pull-down termination unit configured topull-down terminate the interface node, the pull-down termination unitincluding a plurality of parallel resistors configured to be turnedon/off according to the pull-down impedance code, and a resistorconfigured to be turned on/off according to the value stored in thestorage unit.

According to yet another embodiment of the present invention, animpedance adjusting device includes: a first comparison unit configuredto compare a reference voltage with a voltage of a first calibrationnode; a first counting unit configured to generate a pull-up impedancecode according to a comparison result of the first comparison unit; apull-up reference impedance unit configured to have an impedance valueaccording to the pull-up impedance code and to pull up the firstcalibration node; a dummy reference impedance unit configured to have animpedance value according to the pull-up impedance code and to pull up asecond calibration node; a second comparison unit configured to comparethe reference voltage with the voltage of the second calibration node; asecond counting unit configured to generate a pull-down impedance codeaccording to a comparison result of the second comparison unit; astorage unit configured to store a comparison result of the firstcomparison unit upon the generation of the pull-up and pull-downimpedance codes being completed; a pull-down termination unit configuredto pull-up terminate an interface node, the pull-up termination unitincluding a plurality of parallel resistors configured to be turnedon/off according to the pull-up impedance code, and a resistorconfigured to be turned on/off according to a value stored in thestorage unit; and a pull-down termination unit configured to pull-downterminate the interface node, the pull-down termination unit including aplurality of parallel resistors configured to be turned on/off accordingto the pull-down impedance code, and a resistor configured to be turnedon/off according to the value stored in the storage unit.

According to still another embodiment of the present invention, animpedance adjusting device includes: a calibration circuit configured tocompare a voltage of a calibration node and a reference voltage, count acomparison result, generate an impedance code, and store a finalcomparison result; and a termination circuit configured to having animpedance value according to the impedance code and the final comparisonresult.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of a conventional calibration circuit.

FIG. 2 is a circuit diagram of a conventional termination circuit.

FIG. 3 illustrates the variation in the voltage of a calibration nodeaccording to the calibration operation of the calibration circuit.

FIG. 4 is a diagram of a calibration circuit of an impedance adjustingdevice according to a first embodiment of the present invention.

FIGS. 5A and 5B illustrate the process in which the calibration node ZQvoltage changes according to the calibration operation and the processin which a TRIM value is stored in a storage unit 440.

FIG. 6 is a circuit diagram of the terminal circuit of the impedanceadjusting device according to the first embodiment of the presentinvention.

FIG. 7 is a diagram of a calibration circuit of an impedance adjustingdevice according to a second embodiment of the present invention.

FIG. 8 is a circuit diagram of the terminal circuit of the impedanceadjusting device according to the first embodiment of the presentinvention.

DESCRIPTION OF THE INVENTION

Exemplary embodiments of the present invention are described below indetail with reference to the accompanying drawings. The presentinvention may, however, be embodied in different forms and should not beconstructed as being limited to the embodiments set forth herein.Rather, these embodiments are provided so that this disclosure will bethorough and complete, and will fully convey the scope of the presentinvention to those skilled in the art. Throughout the disclosure, likereference numerals refer to like parts throughout the various figuresand embodiments of the present invention.

An impedance adjusting device includes a calibration circuit and atermination circuit.

FIG. 4 is a diagram of a calibration circuit of an impedance adjustingdevice according to a first embodiment of the present invention. In thefirst embodiment of the present invention, the calibration circuit (seeFIG. 4) generates a single impedance code, and the termination circuit(see FIG. 6) terminates an interface node in a single direction.

The calibration circuit is configured to compare a calibration node ZQvoltage with a reference voltage VREF, count an UP/DOWN comparisonresult, and generate an impedance code PCODE<0:N>. The calibrationcircuit stores a final UP/DOWN comparison result. Specifically, asillustrated in FIG. 4, the calibration circuit includes a comparisonunit 410, a counting unit 420, a reference impedance unit 430, and astorage unit 440. The comparison unit 410 compares the reference voltageVREF with the calibration node ZQ voltage. The counting unit 420 isconfigured to count the impedance code PCODE<0:N> according to theUP/DOWN comparison result of the comparison unit 410. The referenceimpedance unit 430 has an impedance value determined by the impedancecode PCODE<0:N> and is connected to the calibration node ZQ. The storageunit 440 stores the UP/DOWN comparison result of the comparison unit 410when the generation of the impedance code PCODE<0:N> has been completed.A calibration enable signal CAL_EN, inputted to the comparison unit 410and the counting unit 420, enables the calibration operation. While thecalibration enable signal CAL_EN is activated, the comparison unit 410and the counting unit 420 generate the impedance code PCODE<0:N>. Whilethe calibration enable signal CAL_EN is deactivated, the comparison unit410 and the counting unit 420 stop operating, and the value of theimpedance code PCODE does not change.

Unlike the conventional calibration circuit, the calibration circuit ofFIG. 4 further includes the storage unit 440, as well as the sectionwhich generates the impedance code PCODE<0:N>.

The storage unit 440 stores the UP/DOWN comparison result of thecomparison unit 410 when the generation of the impedance code PCODE<0:N>has been completed. Storing the UP/DOWN comparison result of thecomparison unit 410 when the generation of the impedance code PCODE<0:N>has been completed includes storing the UP/DOWN comparison resultgenerated by the final comparison operation of the comparison unit 410within the calibration operation time period. The storage unit 440operates in response to a latch enable signal LAT_EN. The latch enablesignal LAT_EN may be activated immediately before the deactivation timeperiod of the calibration enable signal CAL_EN.

The storage unit 440 stores the final UP/DOWN comparison result obtainedwithin the calibration operation time period. If the final UP/DOWNcomparison result is high, the counting of the final impedance codePCODE<0:N> is performed in a direction which increases the impedancevalue of the reference impedance unit 430. On the other hand, if thefinal UP/DOWN comparison result is low, the counting of the finalimpedance code PCODE<0:N> is performed in a direction which decreasesthe impedance value of the reference impedance unit 430. Therefore, ifthe final UP/DOWN comparison result is a high value, the impedance valueof the reference impedance unit 430 is made larger than the impedancevalue of the external resistor 401. If the final UP/DOWN comparisonresult is a low value, the impedance value of the reference impedanceunit 430 is made smaller than the impedance value of the externalresistor 401.

As such, a TRIM value stored in the storage unit 440 has information asto which of the impedance value of the external resistor 401 and theimpedance value of the reference impedance unit 430 is larger after thegeneration of the impedance code PCODE<0:N> has been completed. That is,the TRIM value stored in the storage unit 440 has information as towhich direction the quantization error occurs after the calibrationoperation has been completed.

Although a comparator is illustrated in FIG. 4 as an example of thecomparison unit 410, a variety of circuits designed to perform thecomparison operation may also be used. Moreover, although a counter isillustrated in FIG. 4 as an example of the counting unit 420, a varietyof circuits designed to increase/decrease the value of the impedancecode PCODE<0:N> (to increase/decrease the code of the activated signal)according to the comparison result may also be used.

FIGS. 5A and 5B illustrate the process in which the calibration node ZQvoltage changes according to the calibration operation and the processin which the TRIM value is stored in the storage unit 440.

Referring to FIG. 5A, the impedance code PCODE<0:N> is changed by theoperation of the comparison unit 410 and the counting unit 420 andaccordingly, the calibration node ZQ voltage is moved toward thereference voltage VREF. After a set period of time, the calibration nodeZQ voltage repetitively becomes first higher and then lower than thereference voltage VREF. When the calibration operation has beencompleted, that is, the calibration enable signal CAL_EN has beendeactivated, the value of the impedance code PCODE<0:N> does not change,and the calibration node ZQ voltage is kept lower than the referencevoltage VREF. The voltage of the calibration node ZQ becomes lower thanthe reference voltage VREF because the final UP/DOWN comparison resultof the comparison unit 410 is a high value and thus, the impedance codePCODE<0:N> is counted in a direction which increases the impedance valueof the reference impedance unit 430. The high value, which is the finalUP/DOWN comparison result of the comparison unit 410, is stored in thestorage unit 440 (TRIM=HIGH).

Referring to FIG. 5B, the impedance code PCODE<0:N> is changed by theoperation of the comparison unit 410 and the counting unit 420 and thusthe voltage of the calibration node ZQ is moved toward the referencevoltage VREF. After a certain time point, the voltage of the calibrationnode ZQ repetitively becomes higher and lower than the reference voltageVREF. When the calibration operation is completed, that is, thecalibration enable signal CAL_EN is deactivated, the value of theimpedance code PCODE<0:N> does not change, and the voltage of thecalibration node ZQ is kept higher than the reference voltage VREF. Thereason why the voltage of the calibration node ZQ becomes higher thanthe reference voltage VREF is that the final comparison result UP/DOWNof the comparison unit 410 is low and thus the impedance code PCODE<0:N>is counted in a direction which decreases the impedance value of thereference impedance unit 430. The low value which is the finalcomparison result UP/DOWN of the comparison unit 410 is stored in thestorage unit 440 (TRIM=LOW).

FIG. 6 is a configuration diagram of the terminal circuit of theimpedance adjusting device according to the first embodiment of thepresent invention.

The impedance value of the termination circuit is determined accordingto the impedance code PCODE<0:N> and the final comparison result TRIMstored in the storage unit 440. Referring to FIG. 6, the terminationcircuit includes a plurality of parallel resistors 611 to 615 configuredto be turned on/off in response to the impedance code PCODE<0:N>, and aparallel resistor 616 configured to be turned on/off in response to theTRIM value stored in the storage unit 440. An interface node to whichthe interface pad is connected is terminated using the resistors 611 to615 and 616.

Transistors 601 to 606 configured to be turned on/off in response to thetermination enable signal PU_EN are connected in series to the resistors611 to 615 and 616 inside the termination circuit. When the terminationenable signal PU_EN is deactivated to a high level, the resistors 611 to615 and 616 are turned off. On the other hand, when the terminationenable signal PU_EN is activated to a low level, the resistors 611 to615 and 616 are turned on/off by the impedance code PCODE<0:N> or theTRIM value stored in the storage unit 440.

The following description will be made on the assumption that thetermination enable signal PU_EN is activated to a low level.

Transistors 621 to 625 configured to receive the impedance codePCODE<0:N> are connected in series to the resistors 611 to 615.Therefore, the resistors 611 to 615 are turned on/off by the impedancecode PCODE<0:N>. This operation is identical to that of the conventionaltermination circuit.

The resistor 616 is turned on when the TRIM value stored in the storageunit 440 is high, and turned off when the TRIM value stored in thestorage unit 440 is low. This operation is possible because thetransistor 626 receiving the inverted TRIM value stored in the storageunit 440 is connected in series to the resistor 616.

As described above, the TRIM value is high when the current impedancevalue of the reference impedance unit 430 is greater than the impedancevalue (target value) of the external resistor 401, and the TRIM value islow when the current impedance value of the reference impedance unit 430is smaller than the impedance value (target value) of the externalresistor 401. The termination circuit tends to have the same impedanceas the reference impedance unit 430. That is, when the impedance valueof the reference impedance unit 430 is greater than the target value,the impedance value of the termination circuit is also greater than thetarget value. When the impedance value of the reference impedance unit430 is smaller than the target value, the impedance value of thetermination circuit is also smaller than the target value. The resistor601 decreases the impedance value of the termination value when it isgreater than the target value, and increases the impedance value of thetermination value when it is smaller than the target value.

Although the resistors 601 to 615 and 616 and the transistors 601 to 606and 621 to 626, which turn on/off the resistors 601 to 615 and 616, areseparately illustrated in FIG. 6, the termination circuit may includeonly the transistors 601 to 606 and 621 to 626, without any resistors,because the transistors 601 to 606 and 621 to 626 have resistancecomponents in themselves. In this case, the resistors in this embodimentmay refer to the transistors.

Although the calibration circuit generates the pull-up impedance codePCODE<0:N> and the termination circuit terminates the interface node inthe pull-up direction have been exemplarily described above withreference to FIGS. 4 to 6, it is apparent that the calibration circuitmay generate the pull-down impedance code and the termination circuitmay terminate the interface node in the pull-down direction.

FIG. 7 is a diagram of a calibration circuit of an impedance adjustingdevice according to a second embodiment of the present invention. In thesecond embodiment of the present invention, the calibration circuit (seeFIG. 7) generates two impedance codes, and the termination circuit (seeFIG. 8) terminates an interface node in both pull-up and pull-downdirections.

The calibration circuit is compares voltages of calibration nodes ZQ andA with a reference voltage VREF, counts comparison results UP/DOWN1 andUP/DOWN2, and generates impedance codes PCODE<0:N> and NCODE<0:N>. Thecalibration circuit stores a final UP/DOWN2 comparison result.Specifically, as illustrated in FIG. 7, the calibration circuit includesa first comparison unit 710, a first counting unit 720, a pull-upreference impedance unit 730, a dummy reference impedance unit 740, asecond comparison unit 750, a second counting unit 760, a pull-downreference impedance unit 770, and a storage unit 780. The firstcomparison unit 710 compares the reference voltage VREF with the firstcalibration node ZQ voltage. The first counting unit 720 counts up thepull-up impedance code PCODE<0:N> according to the UP/DOWN1 comparisonresult of the first comparison unit 710. The pull-up reference impedanceunit 730 has an impedance value determined by the pull-up impedance codePCODE<0:N> and pull up the first calibration node ZQ. The dummyreference impedance unit 740 has an impedance value determined by thepull-up impedance code PCODE<0:N> and pulls up the second calibrationnode A. The second comparison unit 750 compares the reference voltageVREF with the voltage of the second calibration node A. The secondcounting unit 760 counts the pull-down impedance code NCODE<0:N>according to the UP/DOWN2 comparison result of the second comparisonunit 750. The pull-down reference impedance unit 770 has an impedancevalue determined by the pull-down impedance code NCODE<0:N> and pullsdown the second calibration node A. The storage unit 780 stores theUP/DOWN2 comparison result of the second comparison unit 750 when thegeneration of the pull-up impedance code PCODE<0:N> and the pull-downimpedance code NCODE<0:N> have been completed. A calibration enablesignal CAL_EN inputted to the first and second comparison units 710 and750 and the first and second counting units 720 and 760 enables thecalibration operation. While the calibration enable signal CAL_EN isactivated, the first and second comparison units 710 and 750 and thefirst and second counting units 720 and 760 generate the pull-upimpedance code PCODE<0:N> and the pull-down impedance code NCODE<0:N>.While the calibration enable signal CAL_EN is deactivated, the first andsecond comparison units 710 and 750 and the first and second countingunits 720 and 760 stop operating, and the values of the pull-upimpedance code PCODE and the pull-down impedance code NCODE<0:N> do notchange.

Unlike the conventional calibration circuit, the calibration circuit ofFIG. 7 further includes the storage unit 440, as well as the sectionwhich generates the pull-up impedance code PCODE<0:N> and the pull-downimpedance code NCODE<0:N>.

The storage unit 780 stores the UP/DOWN2 comparison result of the secondcomparison unit 750 when the generation of the pull-up impedance codePCODE<0:N> and the pull-down impedance code NCODE<0:N> has beencompleted. Storing the UP/DOWN2 comparison result of the secondcomparison unit 750 when the generation of the pull-up impedance codePCODE<0:N> and the pull-down impedance code NCODE<0:N> is completedincludes storing the UP/DOWN2 comparison result generated by the finalcomparison operation of the second comparison unit 750 within thecalibration operation period. The storage unit 780 operates in responseto a latch enable signal LAT_EN. The latch enable signal LAT_EN may beactivated when the calibration enable signal CAL_EN is deactivated.

The storage unit 780 stores the final UP/DOWN2 comparison resultobtained within the calibration operation period. If the final UP/DOWN2comparison result is a high value, the last updating of the pull-downimpedance code NCODE<0:N> is performed in a direction which increasesthe impedance value of the pull-down reference impedance unit 770. Onthe other hand, if the final UP/DOWN2 comparison result is a low value,the last updating of the pull-down impedance code NCODE<0:N> isperformed in a direction which decreases the impedance value of thepull-down reference impedance unit 770. Therefore, if the finalcomparison result UP/DOWN2 is a high value, the impedance value of thepull-down reference impedance unit 770 becomes greater than theimpedance value of the dummy reference impedance unit 740. If the finalcomparison result is a low value, the impedance value of the pull-downreference impedance unit 770 becomes smaller than the impedance value ofthe dummy reference impedance unit 740.

As such, a TRIM value stored in the storage unit 780 has information asto which of the impedance value of the dummy reference impedance unit740 and the impedance value of the pull-down reference impedance unit770 is larger after the generation of the pull-up impedance codePCODE<0:N> and the pull-down impedance code NCODE<0:N> has beencompleted. That is, the TRIM value stored in the storage unit 780 hasinformation as to which direction the quantization error occurs afterthe calibration operation has been completed.

Although the storage unit 780 stores the UP/DOWN2 comparison result ofthe second comparison unit 750, as illustrated in FIG. 7, the storageunit 780 may also store the UP/DOWN1 comparison result of the firstcomparison unit 710. This is because the final UP/DOWN1 comparisonresult of the first comparison unit 710 also has information as to whichof the impedance value of the dummy reference impedance unit 740 and theimpedance value of the pull-down reference impedance unit 770 is larger.In such a modification, the UP/DOWN1 comparison result must be invertedand then stored, or stored and then inverted. However, the basicprinciple of the embodiment of the present invention is identical.

FIG. 8 is a diagram of the terminal circuit of the impedance adjustingdevice according to the first embodiment of the present invention.

The impedance value of the termination circuit is determined accordingto the impedance codes PCODE<0:N> and NCODE<0:N> and the finalcomparison result TRIM stored in the storage unit 780. Referring to FIG.8, the termination circuit includes pull-up termination unit 810 topull-up terminate the interface node to which the interface pad isconnected, and a pull-down termination unit 860 to pull-down terminatethe interface node.

The pull-up termination unit 810 includes a plurality of parallelresistors 811 to 815 which are turned on/off in response to the pull-upimpedance code PCODE<0:N>, and a resistor 816 which is turned on/off inresponse to the TRIM value stored in the storage unit 780. Transistors831 to 836, which are turned on/off in response to a pull-up terminationenable signal PU_EN, are connected in series to the resistors 811 to 815and 816 within the pull-up termination unit 810. When the pull-uptermination enable signal PU_EN is deactivated to a high level, theresistors 811 to 815 and 816 are turned off. On the other hand, when thepull-up termination enable signal PU_EN is activated to a low level, theresistors 811 to 815 and 816 are turned on/off by the pull-up impedancecode PCODE<0:N> or the TRIM value stored in the storage unit 780. Thefollowing description assumes that the pull-up termination enable signalPU_EN is activated to a low level.

Transistors 841 to 845 receive the pull-up impedance code PCODE<0:N> andare connected in series to the resistors 811 to 815. Therefore, theresistors 811 to 815 are turned on/off by the pull-up impedance codePCODE<0:N>. The resistor 816 is turned on when the TRIM value stored inthe storage unit 780 is low, and turned off when the TRIM value storedin the storage unit 780 is high. This operation is possible because thetransistor 846 receiving the TRIM value stored in the storage unit 780is connected to the resistor 816.

The pull-down termination unit 860 includes a plurality of parallelresistors 861 to 865 which are turned on/off in response to thepull-down impedance code NCODE<0:N>, and a resistor 866 which is turnedon/off in response to the TRIM value stored in the storage unit 780.Transistors 881 to 886 are turned on/off in response to a pull-downtermination enable signal PD_EN and are connected in series to theresistors 861 to 865 and 866 within the pull-down termination unit 860.When the pull-down termination enable signal PD_EN is deactivated to alow level, the resistors 861 to 865 and 866 are turned off. On the otherhand, when the pull-down termination enable signal PD_EN is activated toa high level, the resistors 861 to 865 and 866 are turned on/off by thepull-down impedance code NCODE<0:N> or the TRIM value stored in thestorage unit 780. The following description assumes that the pull-downtermination enable signal PD_EN is activated to a high level.

Transistors 891 to 895 receive the pull-down impedance code NCODE<0:N>and are connected in series to the resistors 861 to 865. Therefore, theresistors 861 to 865 are turned on/off by the pull-down impedance codeNCODE<0:N>. The resistor 866 is turned on when the TRIM value stored inthe storage unit 780 is high, and turned off when the TRIM value storedin the storage unit 780 is low. This operation is possible because thetransistor 896 receiving the TRIM value stored in the storage unit 780is connected to the resistor 866.

When the TRIM value stored in the storage unit 780 is high, the resistor816 is turned off so that the impedance value of the pull-up terminationunit 810 is increased, and the resistor 866 is turned on so that theimpedance value of the pull-down termination unit 860 is increased. Onthe other hand, when the TRIM value stored in the storage unit 780 islow, the resistor 816 is turned on so that the impedance value of thepull-up termination unit 810 is decreased, and the resistor 866 isturned on so that the impedance value of the pull-down termination unit860 is decreased.

As described above, the TRIM value is high when the impedance value ofthe pull-down reference impedance unit 770 is greater than the impedancevalue of the dummy reference impedance unit 740, and the TRIM value islow when the impedance value of the pull-down reference impedance unit770 is smaller than the impedance value of the dummy reference impedanceunit 740.

The dummy reference impedance unit 740 tends to have the same impedanceas the pull-up termination unit 810, and the pull-down referenceimpedance unit 770 tends to have the same impedance as the pull-downtermination unit 860. That is, when the impedance value of the dummyreference impedance unit 740 is greater than the impedance value of thepull-down reference impedance unit 770, the impedance value of thepull-up termination unit 810 is also greater than the impedance value ofthe pull-down termination unit 860. When the impedance value of thedummy reference impedance unit 740 is smaller than the impedance valueof the pull-down reference impedance unit 770, the impedance value ofthe pull-up termination unit 810 is also smaller than the impedancevalue of the pull-down termination unit 860. The resistor 816 increasesor decreases the impedance value of the pull-up termination unit 810,and the resistor 886 increases or decreases the impedance value of thepull-down termination unit 860. In this way, the pull-up terminationunit 810 and the pull-down termination unit 860 are made to have theexact target impedance values.

According to the exemplary embodiments of the present invention, theimpedance adjusting device stores the final comparison value (thecomparison value finally generated within the calibration operationperiod), and finely adjusts the impedance value of the termination unitby using the stored final comparison value. Therefore, the accuracy ofthe impedance adjusting device is improved, without increasing the bitnumber of the impedance codes.

While the present invention has been described with respect to thespecific embodiments, it will be apparent to those skilled in the artthat various changes and modifications may be made without departingfrom the spirit and scope of the present invention as defined in thefollowing claims.

1. An impedance adjusting device, comprising: a calibration node coupledto a first impedance; a comparison unit configured to compare areference voltage with a voltage of the calibration node; a countingunit configured to generate an impedance code according to a comparisonresult of the comparison unit; a reference impedance unit connected tothe calibration node and configured to have an impedance value accordingto the impedance code; a storage unit configured to store the comparisonresult of the comparison unit upon the generation of the impedance codebeing completed; an interface node; and a termination unit configured toreceive the impedance code and the comparison result stored in thestorage unit and terminate the interface node, the termination unitincluding a plurality of parallel resistors and an additional parallelresistor, wherein an overall impedance value of current paths throughthe plurality of the parallel resistors is adjusted according to theimpedance code, and an impedance value of a current path through theadditional parallel resistor is adjusted according to the comparisonresult stored in the storage unit, wherein the comparison result storedin the storage unit has information as to which of an impedance value ofthe first impedance at the calibration node and the impedance value ofthe reference impedance unit is larger after the generation of theimpedance code has been completed.
 2. The impedance adjusting device ofclaim 1, wherein the interface node comprises a node connected to a datapad through which data is inputted or outputted.
 3. The impedanceadjusting device of claim 1, wherein the first impedance is an externalresistor.
 4. The impedance adjusting device of claim 1, wherein thecomparison unit and the counting unit are configured to operate for apredetermined period of time during a calibration operation, and whereinthe storage unit is configured to store a final comparison result of thecomparison unit.
 5. An impedance adjusting device, comprising: a firstcalibration node; a first comparison unit configured to compare areference voltage with a voltage of the first calibration node; a firstcounting unit configured to generate a pull-up impedance code accordingto a comparison result of the first comparison unit; a pull-up referenceimpedance unit configured to have an impedance value according to thepull-up impedance code and to pull up the first calibration node; adummy reference impedance unit configured to have an impedance valueaccording to the pull-up impedance code and to pull up a secondcalibration node; a second comparison unit configured to compare thereference voltage with the voltage of the second calibration node; asecond counting unit configured to generate a pull-down impedance codeaccording to a comparison result of the second comparison unit; apull-down reference impedance unit configured to have an impedance valueaccording to the pull-down impedance code and to pull down the secondcalibration node; a storage unit configured to store the comparisonresult of the second comparison unit upon the generation of the pull-upand pull-down impedance codes being completed; an interface node; apull-up termination unit configured to pull-up terminate the interfacenode, the pull-up termination unit including a plurality of firstparallel resistors and a first additional resistor, wherein an overallimpedance value of current paths through the plurality of first parallelresistors is adjusted according to the pull-up impedance code, and animpedance value of a current path through the first additional resistoris adjusted according to a value stored in the storage unit; and apull-down termination unit configured to pull-down terminate theinterface node, the pull-down termination unit including a plurality ofsecond parallel resistors and a second additional resistor. wherein anoverall impedance value of current paths through the plurality of secondparallel resistors is adjusted according to the pull-down impedancecode, and an impedance value of a current path through the secondadditional resistor is adjusted according to the value stored in thestorage unit.
 6. The impedance adjusting device of claim 5, wherein theinterface node comprises a node connected to a data pad through whichdata is inputted or outputted.
 7. The impedance adjusting device ofclaim 5, wherein the first calibration node is connected to an externalresistor.
 8. The impedance adjusting device of claim 5, wherein thefirst comparison unit, the second comparison unit, the first countingunit, and the second counting unit are configured to operate for apredetermined period of time during a calibration operation, and whereinthe storage unit is configured to store a final comparison result of oneof the first and second comparison units.
 9. The impedance adjustingdevice of claim 5, wherein the pull-up termination unit includes apull-up driver of an output driver and the pull-down termination unitincludes a pull-down driver of the output driver, the pull-up driverbeing turned on upon high data being outputted, and the pull-down driverbeing turned on upon low data being outputted.
 10. An impedanceadjusting device, comprising: a first calibration node; a firstcomparison unit configured to compare a reference voltage with a voltageof the first calibration node; a first counting unit configured togenerate a pull-up impedance code according to a comparison result ofthe first comparison unit; a pull-up reference impedance unit configuredto have an impedance value according to the pull-up impedance code andto pull up the first calibration node; a dummy reference impedance unitconfigured to have an impedance value according to the pull-up impedancecode and to pull up a second calibration node; a second comparison unitconfigured to compare the reference voltage with the voltage of thesecond calibration node; a second counting unit configured to generate apull-down impedance code according to a comparison result of the secondcomparison unit; a storage unit configured to store a comparison resultof the first comparison unit upon the generation of the pull-up andpull-down impedance codes being completed; an interface node; a pull-uptermination unit configured to pull-up terminate the interface node, thepull-up termination unit including a plurality of first parallelresistors and a first additional resistor, wherein an overall impedancevalue of current paths through the plurality of first parallel resistorsis adjusted according to the pull-up impedance code, and an impedancevalue of a current path through the first additional resistor isadjusted according to a value stored in the storage unit; and apull-down termination unit configured to pull-down terminate theinterface node, the pull-down termination unit including a plurality ofsecond parallel resistors and a second additional resistor, wherein anoverall impedance value of current paths through the plurality of secondparallel resistors is adjusted according to the pull-down impedancecode, and an impedance value of a current path through the secondadditional resistor is adjusted according to the value stored in thestorage unit.
 11. An impedance adjusting device, comprising: acalibration node; a calibration circuit configured to compare a voltageof the calibration node and a reference voltage, to count a comparisonresult, to generate an impedance code, and to store a final comparisonresult; and a termination circuit having an impedance value according tothe impedance code and the final comparison result wherein the finalcomparison result has information as to which of the voltage of thecalibration node and the reference voltage is larger after thegeneration of the impedance code has been completed.